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Trace Analysis - SIMS, ToFSIMS and ICPMS

Trace analysis enables us to detect impurities in very low concentrations and can play a vital part in your quality control procedure. It is important in the production of semiconductor devices because even trace quantities of contamination can reduce the yield or even cause it to fail.

Trace analysis from SGS offers a trusted specialized service as a fundamental part of your quality control manufacturing. Our experienced staff work with high-performance equipment to pinpoint trace impurities that could cause your product to malfunction or could reduce the reliability. We carry out highly sensitive test procedures using:

  • Secondary Ion Mass Spectrometry (SIMS) – identifies impurities in very low concentrations 
  • Time-of-Flight SIMS (ToF–SIMS) – detects surface impurities
  • Inductively Coupled Plasma Mass Spectroscopy (ICPMS) supported by vapor phase decomposition (VPD) or pack-extraction method (PEM) – highly sensitive to a wide range of elements

Contact SGS to find out how our trace analysis can enhance the quality and reliability of your products.

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SGS North America Inc.
Consumer and Retail

  • Fairfield Laboratory
    291 Fairfield Avenue
    Fairfield, New Jersey, 07004
    United States
  • t   +1 973 575 5252
  • f   +1 973 575 7175
  • e   Email us


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